A Systems Approach to Embedded Microprocessor Testing
| dc.contributor.author | Harman, Thomas L. | |
| dc.contributor.author | Dabney, J. B. | |
| dc.contributor.author | Haynes, Charles S. | |
| dc.date.accessioned | 2019-10-08T15:35:21Z | |
| dc.date.available | 2019-10-08T15:35:21Z | |
| dc.date.issued | 2001-04 | |
| dc.description.abstract | Abstract not available. | en_US |
| dc.identifier.citation | 36. “A Systems Approach to Embedded Microprocessor Testing,” T. L. Harman, James B. Dabney, and Charles S. Haynes, Innovations 2001, Houston, TX, April 2001. | en_US |
| dc.identifier.uri | https://hdl.handle.net/10657.1/1570 | |
| dc.publisher | Innovations 2001 | en_US |
| dc.title | A Systems Approach to Embedded Microprocessor Testing | en_US |
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