A Systems Approach to Embedded Microprocessor Testing
Date
2001-04
Authors
Harman, Thomas L.
Dabney, J. B.
Haynes, Charles S.
Journal Title
Journal ISSN
Volume Title
Publisher
Innovations 2001
Abstract
Abstract not available.
Description
Keywords
Citation
36. “A Systems Approach to Embedded Microprocessor Testing,” T. L. Harman, James B. Dabney, and Charles S. Haynes, Innovations 2001, Houston, TX, April 2001.