Harman, Thomas L.Dabney, J. B.Haynes, Charles S.2019-10-082019-10-082001-0436. “A Systems Approach to Embedded Microprocessor Testing,” T. L. Harman, James B. Dabney, and Charles S. Haynes, Innovations 2001, Houston, TX, April 2001.https://hdl.handle.net/10657.1/1570Abstract not available.